A. Cricenti, R. Generosi, P. Perfetti, G. Margaritondo, J. Almeida, Jonathan Mark Gilligan, Norman Henry Tolk, C. Coluzza, M. Spajer, D. Courjon, & I. D. Aggarwal, Interface applications of scanning near-field optical microscopy with a free electron laser, Physica Status Solidi A: Applied Research 175, 317–329 (1999).  PDF

Abstract:

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«  Nonlinear energy-selective nanoscale modifications of materials and dynamics in metals and semiconductors | Fabrication of single-mode chalcogenide fiber probes for scanning near-field infrared optical microscopy »