Antonio Cricenti, Renato Generosi, Marco Luce, P. Perfetti, G. Margaritondo, D. Talley, J.S. Sanghera, I.D. Aggarwal, Jonathan M. Gilligan, & Norman H. Tolk, “Surface characterisation by near-field microscopy and atomic force microscopy,” Advances in Science and Technology 32, 183–192 (2002).

Abstract:

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